06.19.2022 – 06.24.2022 IEEE MTT-S International Microwave Symposium

Attend the Exhibit Hall for Free and get an opportunity to win a Drone

Register Here To Attend

                                      

For your chance to win, simply pick up a game card at any of our manufacturer’s booths. Visit every manufacturer (and get your card stamped) and you will be entered in our drawing. Completed cards can be left at any of our manufacturer’s booths.

TMS Manufacturers                         Booth #
Anritsu                                                            9038
AR RF/Microwave                                          6030
Astronics Tabor                                         9101
Wireless Telecom Group
      Boonton       CommAgility                      8019
      Holzworth    Noisecom  
Cernex/CernexWave                                    4020
dBm (Maury Microwave)                             8050
FormFactor                                                    8030
IW Microwave                                                5015
Pickering Interfaces                                     11006
Transcat                                                         9099

AR Logo Astronics Logo
Boonton Electronics Logo Holzworth Logo
dBm Logo

For customers that can’t accept awards or prizes, a cash donation in the amount of the drone in lieu of the prize will be made to a charity that you select.

06.07.2022 Introduction to PCI Express® 6.0 PAM4

Introduction to PCI Express® 6.0 PAM4
Physical Layer Testing


REGISTER HERE

Date:  Tuesday, June 7, 2022
Time:  11AM Pacific | 2PM Eastern
Duration:  60 minutes including Q&A
*This webinar has been rescheduled from May 11 to June 7

Intro to PCIe® 6.0 PAM4 Physical Layer Testing
Join Teledyne LeCroy PCIe 6.0 physical-layer test experts explain the challenges that early adopters will face when moving from PCIe 5.0 to PCIe 6.0 and how to overcome these challenges.

Topics to be covered in this webinar:

  • Going from PCIe 5.0 to PCIe 6.0
  • What’s new in PCIe 6.0?
  • Transmitter Base Tx testing
  • Required tools for PCIe 6.0 Tx/Rx testing

Who should attend? Design, validation, and test engineers working on PCIe 6.0 devices.

What attendees will learn? A deeper understanding of the electrical specifications and validation requirements for PCIe 6.0. 

Presented by: Anthony Mickens, Product Manager

Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.

06.08.2022 Part 2: Probing in Power Electronics – What to Use and Why

Probing in Power Electronics – What to Use and Why
Part 2: High Voltage Probe Real-world Examples and Comparisons


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Date:  Wednesday, June 8, 2022
Time:  11AM Pacific | 2PM Eastern
Duration:  60 minutes including Q&A

Probing in Power Electronics – What to Use and Why
Power electronics designs have inherent measurement challenges. There are many specialized high and low voltage single-ended and differential probes to meet the specific needs of this market. However, proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on the accuracy of the measurement.

Part 2: High Voltage Probe Real-world Examples and Comparisons
In this webinar we provide many real-world application examples and probe comparisons to highlight the practical impact of each high voltage probe type’s strengths and weaknesses in different application examples.

Topics to be covered in this webinar:

  • Upper-side gate drive probing
  • Floating sensor signal probing
  • Floating series/shunt resistor probing
  • Voltage/power rail probing

Who should attend? Any engineer who is probing in any type of power conversion system with floating voltages above 12 V.

What attendees will learn? Attendees will gain a thorough understanding of the different types of HV probes and how to choose the best probe for the specific application. 

Presented by: Ken Johnson, Director of Marketing, Product Architect

Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.

06.14.2022 Three Design Tricks to Reduce Switching Noise in Printed Circuit Boards

Three Design Tricks to Reduce Switching Noise in Printed Circuit Boards


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Date:  Tuesday, June 14, 2022
Time:  11AM Pacific | 2PM Eastern
Duration:  60 minutes including Q&A

3 Design Tricks to Reduce Switching Noise in Printed Circuit Boards
Switching noise is the most common source of noise in all digital circuits. You can dramatically reduce switching noise by following the three design principles presented in this webinar.

Join Professor Eric Bogatin and Advanced Assembly to hear best design practices to reduce switching noise. Attendees will learn how to design for test features and the best measurement practices to measure the switching noise in your final product. See how layout decisions can have a dramatic impact on the switching noise in circuit boards when we compare the measured switching noise of good and bad features in the layout.

Topics to be covered in this webinar:

  • Principles of switching noise- the root cause
  • Board design features to reduce switching noise and pathological features to avoid
  • Design for test features
  • Measuring the switching noise with an oscilloscope
  • Analysis of the results: dos and don’ts to reduce switching noise

Who should attend? Hardware engineers who are responsible for the design of circuit boards with digital components or any test or validation engineer who is concerned about measuring the noise on functioning circuit boards.

What attendees will learn? What is switching noise, how to reduce it and how to measure it using an oscilloscope. 

Presented by:  Professor Eric Bogatin, University of Colorado and Teledyne LeCroy Fellow

Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.

06.15.2022 Part 3: Jitter University Webinar Series

Jitter University Webinar Series
Part 3: Taking the Long View of Jitter


REGISTER HERE

Date:  Wednesday, June 15, 2022
Time:  11AM Pacific | 2PM Eastern
Duration:  60 minutes including Q&A

Jitter University Webinar Series
Confused about jitter? Did someone’s explanation of jitter create more questions than answers? If so, join Teledyne LeCroy as we teach everything about jitter – what jitter is, different categories, instruments used, measurements and views, deconvolution and extrapolation, and more. Click here to access the entire series.

Part 3: Taking the Long View of Jitter
In this session we leverage the use of modern digital oscilloscopes to make more jitter measurements faster and more accurately. We will also calculate statistics, view histograms on data sets, and view how jitter changes with time or frequency to better understand underlying jitter pathologies.

Topics to be covered in this webinar:

  • Effectively using long oscilloscope memory for jitter measurements
  • Understanding eye diagrams constructed from a single, long acquisition(s)
  • Basics of statistics and histograms
  • Differences between waveform histograms and math histograms
  • Plots of jitter vs. time – understanding what this describes

Who should attend? Any technician or electrical engineer who is designing or debugging embedded systems and needs to assess clock, clock-data, or data jitter.

What attendees will learn? Attendees will learn how to use long acquisition memories/records, measurements and math to optimize their use of their digital storage oscilloscope for measuring jitter.

Presented by:  Stephen Murphy, Marketing Product Specialist / Applications Engineer

Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.

06.23.2022 Fundamentals of Power Measurement

Yokogawa Logo

DATE:  June 23, 2022        |        TIME:  11:00 AM EST

UPCOMING WEBINAR

FUNDAMENTALS OF POWER MEASUREMENT

While DC power measurements are relatively straight forward, AC power measurements that include distorted waveforms, varying power factors, and multiple phases can add complexity to an otherwise simple measurement.

During this fundamentals webinar, Yokogawa Test & Measurement will cover several power measurement topics including multi-phase measurements, measurement techniques and applications, real-world examples, and more.

Date: June 23, 2022
Time: 11:00 AM EST; 8:00 AM Pacific
Duration: 1 Hour
Webinar ID: 556-034-499

REGISTER NOW

Featured Speaker

Yusuf Chitalwala
Business Operations Manager
North America

Yokogawa Test&Measurement

06.29.2022 Part 3: USB Type-C® Technologies Webinar Series

USB Type-C® Technologies Webinar Series
Part 3: USB4™ and Thunderbolt™ 3/4 Physical Layer Compliance Test Overview


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Date:  Wednesday, June 29, 2022
Time:  11AM Pacific | 2PM Eastern
Duration:  60 minutes with Live Q&A

USB Type-C® Technologies Webinar Series
Join Teledyne LeCroy for our webinar series on USB Type-C technologies with a focus on the physical layer, from an introduction to the various technologies in the Type-C ecosystem to USB 3.2, USB4™, Thunderbolt™ 3, DisplayPort™, USB4 Type-C sideband (USB Power Delivery, DisplayPort AUX, USB4 SB) testing.
Click here to access all 6 sessions

Part 3: USB4™ and Thunderbolt™ 3/4 Physical Layer Compliance Test Overview
In this session we will provide an update of the latest tools available for USB4 electrical validation and compliance testing and requirements to adhere to the USB-IF’s test program.

Topics to be covered in this webinar:

  • The latest CTS requirements
  • The latest software tools including SigTest, USB4 ETT
  • Integration into QPHY-USB4-TX-RX automated compliance software
  • Test fixtures, DUT Controllers, etc.

Who should attend? Electrical validation and test engineers responsible for making sure their company’s or client’s designs are compliant with the USB4 Compliance Test Specification (CTS).

What attendees will learn? The latest status of USB4 electrical compliance tools and the USB-IF test program.

Presented by:  
Mike Engbretson, Product Marketing Manager, Teledyne LeCroy
Hiroshi Goto, Business Development Manager, Anritsu Inc.

Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.

06.30.2022 Part 6: Oscilloscope Coffee Break Webinar Series

Oscilloscope Coffee Break Webinar Series
How to Use Statistical Data and Histograms in Your Oscilloscope


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Date:  Thursday, June 30, 2022
Time:  11AM Pacific | 2PM Eastern
Duration:  30 minutes

Oscilloscope Coffee Break Webinar Series
Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month. Click here to access the entire series.

Part 6:  How to Use Statistical Data and Histograms in Your Oscilloscope
In this session, we describe how to quickly identify circuit issues through the oscilloscope’s measurements, measurement statistics and statistical measurement distributions (histograms)

Topics to be covered in this webinar:

  • How to acquire statistically robust measurement samples
  • Understanding oscilloscope measurement tables
  • Gating large measurement sets
  • What is a histogram and what information does it provide?
  • Using additional tools to debug statistical anomalies

Presented by:  Stephen Murphy, Marketing Product Specialist / Applications Engineer

Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.