12.13.2022 Fourth-Generation Digitizers with Easy-To-Use API

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Fourth-Generation Digitizers with Easy-To-Use API

Learn about the latest generation high-performance data acquisition boards from Teledyne SP Devices

In this webinar, we explain the design principles and operation of our fourth-generation digitizers with a focus on the application programming interface (API).

Topics to be covered in this webinar:

  • Current and planned fourth-generation digitizer models
  • Design principles used for developing these products
  • Example applications that utilize high-performance digitizers
  • Application programming interface (API) details

Date: Tuesday, December 13, 2022
Time: 10 AM PST   |   1 PM EST
Duration: 30 minutes




Unable to Attend? Register anyway to access the webinar on-demand after the event.

Presenter:  Thomas Elter, Senior Field Applications Engineer


On-Demand Webinars and Previous Newsletters Online

On-Demand Webinar on high-level synthesis On-demand webinars on data acquisition boards and their applications New High-Speed Digitizer With Extended Dynamic Range
Join our webinar to learn the basics of HLS in the context of high-performance digitizers.

View now >


Dive into the world of digitizers and explore how they can benefit your application. Explore the basics of digitizers, pulse detection, peer-to-peer streaming, and more.

Learn more >

ADQ32-PDRX – the first digitizer product that utilizes our new Pulse Dynamic Range eXtension (PDRX) technology to achieve 3 additional bits of dynamic range.

Learn more >




December 6, 2022 2PM Eastern
11AM Pacific



While DC power measurements are relatively straight forward, AC power measurements that include distorted waveforms, varying power factors, and multiple phases can add complexity to an otherwise simple measurement.

During this power fundamentals webinar, Yokogawa Test&Measurement covers multiple fundamentals of power measurement.

Key topics include: 

  • Multi-phase measurements
  • Measurement techniques
  • Measurement applications
  • Real-world examples and more
Register Now

Featured Speaker

Kourtney Morrison Turner
Applications Engineer
North America

Yokogawa Test&Measurement



12.01.2022 Semiconductor Industry: Beachheads That Drive the Innovation

December 1 (US/EU) and December 2 (Asia) | Online


FormFactor invites you to join us on December 1-2 for a virtual event presented to our users in the US/EU and Asia.


Semiconductor Industry:
Beachheads That Drive the Innovation

Guillaume Girardin
Chief Technology Officer, Yole Intelligence, part of Yole Group


FormFactor’s COMPASS users’ group conference brings together FormFactor customers and experts from around the world to discuss the products and technologies shaping our future. Industry leaders and speakers from corporations, leading-edge research institutions and FormFactor share test insights on the semiconductor market today and a variety of emerging on-wafer test and measurement applications, such as advanced packaging, high-power semiconductors, automotive devices, high-speed digital, silicon photonics, and 5G/6G/millimeter-wave mobile devices.


● Executive Welcome
● 5G mmWave: Multi-site RF Probe Cards Enable Lower Cost-of-test in Mass Production
● Advances in High-Speed Digital Test Using Vertical MEMS
● FRT Metrology for Advanced Packaging
● High Throughput SiC Metrology and Inspection
● Quantum/CryoCMOS: Enabling the Future of Computing
● Fully Automated Integrated Silicon Photonic Wafer Test



Thursday, December 1, 2022
9:00am – 12:00pm PST



Friday, December 2, 2022
18:00 – 21:00 CET


11.30.2022 Jitter University Webinar Series Part 7: Advanced Course on Serial Data Jitter Measurements

Jitter University Webinar Series
Part 7: Advanced Course on Serial Data Jitter Measurements


Date:  Wednesday, November 30, 2022
Time:  11AM Pacific | 2PM Eastern
Duration:  60 minutes including Q&A

Jitter University Webinar Series
Confused about jitter? Did someone’s explanation of jitter create more questions than answers? If so, join Teledyne LeCroy as we teach everything about jitter – what jitter is, different categories, instruments used, measurements and views, deconvolution and extrapolation, and more. Click here to access the entire series.

Part 7: Advanced Course on Serial Data Jitter Measurements
In this session our technical expert dives deeper into the various measured and extrapolated jitter views, explain statistical and time-varying views of jitter in serial data link margins as viewed with an eye diagram.

Topics to be covered in this webinar:

  • Using S-parameters to characterize serial data links
  • Using serial data link emulation and equalization tools
  • Impact of phase-locked loop (PLL) settings on clock data recovery (CDR) performance
  • Real-world simulations to illustrate impact of various jitter components
  • Measurement differences for various serial data standards

Who Should Attend? Any electrical engineer who is designing, validating or debugging systems with high-speed serial data links.

What Attendees will learn? Attendees will learn how to interpret and correlate high jitter values to visual eye diagram representations of serial data and how to use various link analysis tools to assess real-world link performance.

Presented by:  Alan Blankman, Ph.D, Senior Software Engineer

Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.