4/1/2020 – Teledyne LeCroy Webinar: Advanced TDR Concepts

Date: Wed, April 1, 2020
Time: 11:00am Pacific | 2:00pm Eastern
A TDR can measure much more than just the impedance profile of a transmission line. In this webinar, Dr. Eric Bogatin shows how to use a TDR to measure the dielectric constant of a laminate, the excess capacitance or inductance of a discontinuity, the return loss of an interconnect with a matched termination, the resonant frequencies of structures and the impedance uniformity of a flex circuit or interconnect with high series resistance.

When your needs require higher bandwidth, more ports, cross talk, insertion and return loss measurements, he’ll introduce you to a more advanced instrument to meet your most demanding needs.

This is the final webinar in our six-part series on Mastering the TDR. To view previous webinars in the series please click below:

Advanced TDR Concepts Webinar

Presenter: Eric Bogatin, Dean of the Signal Integrity Academy

 

REGISTER HERE*

*Can't attend live? Register anyway and we will send you the recording and slides afterward.

3/4/2020 – Teledyne LeCroy Webinar: Principles of De-embedding

Date: Wed, Mar 4, 2020
Time:
 11:00am Pacific | 2:00pm Eastern
This is the fifth webinar in our six-part High Speed Interconnect Characterization webinar series.

A fixture is commonly used as a geometry transformer between the coax connection of the instrument and the Device Under Test (DUT). If we want the S-parameters of just the DUT and not the DUT + fixture, we have to “de-embed” the DUT from the composite measurement.

In this webinar, we will introduce the principles behind de-embedding and how it can be dramatically simplified using best measurement practices. It is a powerful technique which should be in everyone’s tool box.

To view previous webinars in the series please click below:

Mastering

Presenter: Eric Bogatin, Dean of the Signal Integrity Academy

 

REGISTER HERE*

*Can't attend live? Register anyway and we will send you the recording and slides afterward.

2/12/2020 – Teledyne LeCroy Webinar: Fundamentals of Power Integrity

Date: Wed, February 12, 2020
Time: 11:00am Pacific | 2:00pm Eastern

Power Integrity concerns maintaining the quality of power from generation to consumption. High power integrity means noise levels that are within tolerance. In this webinar we will look at defining what power integrity is and why it matters.

Dr. Patrick Connally will review the types of power distribution network noise which include: 1) Self aggression noise, 2) Pollution of the board/package interconnects and 3) Mutual aggressors.

We will conclude with best measurement practices with real world examples.

Fundamentals of Power Integrity Webinar

 

Presenter: Dr. Patrick Connally, Product Marketing Manager, Teledyne LeCroy

 

REGISTER HERE*

*Can't attend live? Register anyway and we will send you the recording and slides afterward.

2/5/2020 – Teledyne LeCroy Webinar: Analyzing Discontinuities with a TDR

Date: Wed, Feb 5, 2020
Time: 11:00am Pacific | 2:00pm Eastern
When the instantaneous impedance is flat, we interpret the TDR response as the characteristic impedance of the interconnect. When the instantaneous impedance is not flat, but a peak or a dip, we describe the structure as a discontinuity. Its min or max impedance depends on the rise time.

In this webinar, Dr. Eric Bogatin will explore how to think about the discontinuity as a short transmission line or as an excess inductance or capacitance. This is the first step in building a circuit model for the interconnect or “hacking” the interconnect.

This is the fifth webinar in a six-part series on Mastering the TDR. To view previous webinars in the series please click below:

 

Presenter: Eric Bogatin, Dean of the Signal Integrity Academy

 

REGISTER HERE*

*Can't attend live? Register anyway and we will send you the recording and slides afterward.

1/29/2020 – Yokogawa Webinar: Avoiding Detrimental & Misleading Results in Laser & Optical Spectrum Analysis

Yokogawa Live Webinar

 

Wednesday, January 29, 2020
11:00 AM Pacific / 2:00 PM Eastern

 

No longer is the usage of lasers and optical solutions limited to visible laser pointers and traditional communications applications. Optical solutions have expanded into a variety of fields, from guiding a new generation of autonomous vehicles (LiDAR) and enabling facial recognition for smartphones to identifying greenhouse gasses and detecting cancer in the medical field.

Many of these applications require precise analysis of the optical light spectrum displayed (or not displayed) on the test instrument. The analysis techniques behind understanding spectral behaviors is a science in itself; what is not shown on an instrument can be as misleading to your results as what is shown, and vice versa!

Join us in this webinar where our experts discuss:

  • How researchers and engineers can avoid relying on false or misleading results when using an optical spectrum analyzer
  • An overview of spectral measurement technologies
  • Examples from Yokogawa’s 3+ decades of spectral analysis experience
  • Development techniques from our research partners
  • Our new breakthrough OSA with a maximum wavelength limit of 5.5 um – be the first to preview!

Speaker: 

Michael Kwok

Product Manager, Optical Products
Test & Measurement, Yokogawa

Michael has a Bachelor of Science degree in Mechanical Engineering with a minor in electronics. He has over 25 years of industry experience in various fields including Medical, Aerospace, Automotive, and data acquisition. He also has over 20 years of experience specifically in the field of optical analysis and testing. 


Register for the Webinar HERE

1/28/2020-1/30-2020 – Join Anritsu at DesignCon

 

Anritsu’s Hiroshi Goto to participate in Panel—The Case of the Closing Eyes: PAM is the Answer, or Not?

Tuesday, January 28, 4:45 PM – 6:00 PM, Ballroom F Add to Calendar

Join this panel of experts for a lively discussion on the state of testing practices for high-speed networking technologies. This year's panel will be evaluating the pros and cons of characterization efforts for 400GbE over PAM4. Chip experts will discuss design verification challenges while the test & measurement industry veterans will provide direction on testing implementation plans. Come prepared to engage in the discussion!


See Anritsu’s latest signal integrity products at Booth 837

Anritsu will showcase its leading test solutions and techniques to verify high-speed communications featuring the latest technologies, including PCI Express® (PCIe®) 3.0/4.0/5.0 and Ethernet PAM4, during DesignCon 2020 in booth #837. Test solution demonstrations will include:

  • 400G Optical PAM4 TDECQ Test
  • 400G JTOL Test for PAM4 with FEC
  • PCIe G4/G5 LEQ RX Compliance Test
  • Automated High Speed Serial Bus RX Test
  • De-embedding with Universal Fixture Extraction
  • 110 GHz Signal Integrity Measurement

Attend Anritsu's technical sessions and register for a chance to win an Echo Show & Ring!

Thursday, January 30, Great America – Room 2 - Add to Calendar


Request a meeting! CLICK HERE