Date: October 16, 2025
Time: 9:00AM – 9:45 AM MDT
Details
In RF testing, the goal of calibration is to remove the effects of the test setup, including cables, connectors, and adapters, so that the measured results accurately reflect the Device Under Test (DUT) itself. However, performing accurate on-wafer calibrations is challenging, particularly for differential topologies, as the coupling inherent to these precludes accurate measurements unless accounted for. Most traditional RF calibrations do not compensate for this coupling, resulting in inaccurate, and in some cases physically implausible, measurements.
Modal Calibration is one technique to characterise and remove this crosstalk, and is now available, for the first time, in a commercial calibration software.
This webinar will discuss RF calibration techniques, their limitations as applied to differential topologies, and present the Modal Calibration algorithm. Real-world validation results will be demonstrated to illustrate the accuracy improvements which can accrue from its use.
Speaker
James Hibbert
Principal Applications Engineer FormFactor GmbH
James is a key member of FormFactor’s Centre of Expertise, a group comprised of highly experienced engineers and technical specialists responsible for advancing the frontiers of semiconductor wafer testing and measurement. He is specifically focused on overcoming the challenges of accurately characterising RF devices, particularly for emerging applications such as 6G. Prior to his tenure at FormFactor, James was an electronics engineer at Fotenix and interned at Broadcom. He received a doctorate in Electrical Engineering from University of Manchester.