Date: Wednesday, June 17, 2026
Time: 11:00AM Pacific | 2:00PM Eastern
Duration: 60 minutes
Practical MOSFET Testing Using a Double Pulse Test
Double pulse testing is essential for characterizing MOSFET switching performance—but accurate results depend on correct setup and measurement techniques.
Join Teledyne LeCroy for a practical, application-focused session featuring a live demonstration on a GaN MOSFET. Learn how to properly configure your test setup, avoid common measurement errors, and capture reliable switching parameters.
In this wwebinar, you’ll learn how to:
- Set up a double pulse test for accurate and repeatable results
- Select and configure probes and instrumentation
- Apply proper deskew techniques for precise loss measurements
- Verify half-bridge dead time and switching timing
- Measure turn-on/off delays and switching losses
- Evaluate reverse recovery behavior and charge
Who Should Attend?Ideal for engineers who specify, validate, and work hands-on with power semiconductor devices.
Who will attendees learn?Practical techniques for performing the tests used to define power semiconductor specifications
Presenter: Mark Dewitt, Field Applications Engineer
Can’t attend live? Register anyway and you will receive an email with the recording and slides after the live event.