RF Wafer Probing Fundamentals
Click to Register October 20, 2021 | 9:00am PDT/6:00pm CEST
An introduction to RF on-wafer probing and calibration. This webinar will expand your knowledge of techniques and tools available to properly characterize RF devices. The webinar is intended for persons interested in RF testing, with beginning knowledge of the physics and characteristics of RF semiconductors.
What you will learn:
- Different RF probe architectures and how to choose the right probe for your application
- On-wafer calibration: S-parameter basics, calibration methods and software
- On-wafer measurement verification
- Design for Testability
- Temperature testing with RF probes
- Probe cleaning
Overcoming Challenges for Wafer-Level Low Frequency Noise Measurements
Click to Register October 27, 2021 | 9:00am PDT/6:00pm CEST
The development of next generation semiconductor device technology nodes targeted for communications, memory, imaging and various analog applications requires advanced wafer level low noise test and measurement capabilities. Flicker noise (1/f), random telegraph noise (RTN), and phase noise have been demonstrated to affect device behavior and final circuit performance. In today’s test labs, it is vital that test engineers are able to accurately measure the device or circuit noise characteristics in a quiet wafer test environment. For this talk, we will first look at the different types of low frequency noise, how they are measured and their impact on devices as well as various circuit applications. We will also discuss the requirements of a quiet wafer test environment and the challenges of achieving one. Finally a wafer test solution that allows test engineers to make accurate low frequency noise measurements will be presented at the end of this talk.
Free to attend. Register today to reserve your spot.
FormFactor, Inc. | 7005 Southfront Road | Livermore, CA 94551 USA | Ph: (925) 290-4000
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