Anritsu – Zeroing in on Active, Passive, and Opto-electronic Measurements

Anritsu - Zeroing in on Active, Passive, and Opto-electronic Measurements

Anritsu - Zeroing in on Active, Passive, and Opto-electronic Measurements

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Date:  Tuesday, January 12, 2021

Time:  11:00 AM EST

Duration: 1 Hour

When it comes to testing active, passive, or opto-electronic (O/E) devices, a vector network analyzer (VNA) is the most important Test and Measurement instrument required. With increasing application development in higher frequencies, the challenges in making them with the same accuracy and precision have become more difficult and even elusive at times.

This webinar will delve into important factors that need to be followed when making VNA measurements at higher frequencies and discuss techniques for O/E devices.

Who should attend:

  • Education and R&D
  • Aerospace and Defense
  • Opto-electronic device characterization engineers/organization

What you will learn:
During this event, you will learn why performing VNA measurements of active, passive, and O/E devices becomes more difficult as you enter into higher frequency domains and emphasize advanced embedding and de-embedding techniques for measuring various networks.

Presented by - Navneet Kataria

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