Date: Wed, Mar 4, 2020
Time: 11:00am Pacific | 2:00pm Eastern
This is the fifth webinar in our six-part High Speed Interconnect Characterization webinar series.
A fixture is commonly used as a geometry transformer between the coax connection of the instrument and the Device Under Test (DUT). If we want the S-parameters of just the DUT and not the DUT + fixture, we have to “de-embed” the DUT from the composite measurement.
In this webinar, we will introduce the principles behind de-embedding and how it can be dramatically simplified using best measurement practices. It is a powerful technique which should be in everyone’s tool box.
To view previous webinars in the series please click below:
- Part 1: Beyond the TDR
- Part 2: Reading S-Parameters Like a Book
- Part 3: Lossy Interconnects and Insertion Loss
- Part 4: Mixed mode S-parameters and TDR responses
Presenter: Eric Bogatin, Dean of the Signal Integrity Academy
*Can't attend live? Register anyway and we will send you the recording and slides afterward.