Webinar

Making Accurate and Consistent Wafer Measurements with Next Generation Guarded True-Kelvin MEMS DC Probes

Thursday, September 5, 2024 – Register Now

FormFactor invites you to join us for a webinar hosted by Dr. Choon Beng Sia on Thursday, September 5th – Making Accurate and Consistent Wafer Measurements with Next Generation Guarded True-Kelvin MEMS DC Probes.

Gate length down-scaling in silicon-based transistors results in very small on-state drain-source resistance, which makes it challenging for test engineers to perform precise and repeatable wafer measurements. Reducing the size of aluminum-capped copper test pads to save on lithography, prototyping, and production costs makes it very difficult to re-probe the same device with low contact resistance. In this webinar, we will discuss novel true-Kelvin MEMS analytical DC probes, along with new testing and modeling strategies, to address these emerging test challenges.

Note: This webinar will also be presented in Chinese on November 14, 2024. To register for the Chinese-language session, please visit here.

HOSTED BY:

Dr. Choon Beng Sia is an SSG Fellow, conferred by the President of the Republic of Singapore. At FormFactor’s Center of Expertise, he is a Technical Director responsible for developing solutions to overcome semiconductor wafer test challenges. Dr. Sia serves in the IEEE MTT-3 technical committee, defining standards and best practices for RF measurements. He is also a lecturer of the MTT-3 speaker bureau, specializing in wafer RF and 5G tests. Dr Sia is a recipient of multiple best paper awards at international conferences, publishing more than 50 scientific papers, holding 13 international patents.