Date: Wed, September 4
Time: 11:00AM Pacific | 2:00PM Eastern
Presenter: Eric Bogatin, Dean of the Signal Integrity Academy
In this webinar, we open the black box of S-parameters to reveal the essential principles to build an intuitive understanding of what they are and how their patterns reveal physical features in the interconnects. In particular, we explore the connection between return and insertion loss and how the physical design of interconnects affects these two S-parameters.
After this webinar, you will never be intimidated by S-parameters again
Can't make the live event? Register to receive the recording when available