Microwave Journal Webinar Event
WEBINAR: Digital Component Accelerated Life Testing with RF
Date: Wednesday, August 10th, 2022 Time: 11:00 AM EDT
Wireless front-end components are potentially subjected to high-stress levels. Because of this, operational RF drive levels and currents exacerbate the potential for failure. Additionally, connection to an antenna permits to ingress of external energy. Manufacturing variance and defect can contribute to the possible life span. These aspects require specialized testing to capture both early failures and long-term wear-out. This presentation will consider the parameters and equipment necessary to accurately specific Mean Time to Failure (MTTF) and capture Early Failure Rate (EFR).
Speaker: Dean Landers
Supervisor, Applications Engineer
AR RF/Microwave Instrumentation