TMS Divisions:

Test & Measurement Embedded Systems   Distribution

Upcoming Events 

To view previous Webinars, please visit our Application Notes & Videos Page

 

Automotive Ethernet Physical Layer Compliance Tetsing


When: November 14, 2017

11:00 AM PDT / 2:00 PM EDT

REGISTER HERE

 

Abstract:

There are numerous design challenges associated with implementing Automotive Ethernet. This session will discuss what to test in order to improve the chances of a successful design.

Specifically, we will cover Physical Layer testing for 100 Mb/s Automotive Ethernet as it is described in both the BroadR-Reach and 100Base-T1 (IEEE 802.3bw) specifications. Each of the different tests will be covered in detail. 

Who should attend: Engineers and Technicians looking to learn more about the physical layer test process for Automotive Ethernet/BroadR-Reach. Beginners are welcome; this course will start at the ground level and build upon the basics discussed.

What attendees learn: Become an expert on the physical layer testing process. Each test will be covered in detail.


Cost: FREE, registration is required
 

Presenter: Robert Mart
Product Line Manager at Teledyne LeCroy

 

 

Getting the Most Out of Your Oscilloscope

"It's about the tools"


When: November 15, 2017

10:00 AM PDT / 1:00 PM EDT

REGISTER HERE

 

Abstract:

 

In today’s high tech world, modern oscilloscopes offer a multitude of analysis tools enabling engineers and technicians to gain insight into circuit behavior and quickly find problems and document results. This webinar will briefly review scope features and capability that will have you thinking “I didn’t know my scope could do this” to make identifying issues and troubleshooting faster and easier.

 

After a brief confirmation that the scope acquisition setup supports what we are looking to measure, we will review details of using: gating parameters, histicons, measurement search and filter tools, MatLab and custom measurements, trends and tracks to graph results, pass/fail limit testing, jitter timing analysis, integrating parallel mixed-signal and serial data PHY layer tools, and documentation of test data and results.
 
Who should attend:  Engineers and Technicians who use oscilloscopes and want to learn how to use get faster insight to circuit performance and troubleshooting skills.

Cost:  FREE, registration is required
 

Presenter: Steve Murphy
Applications Engineer at Teledyne LeCroy

 

 

Low Frequency Passive and High Frequency Active Probing Techniques and Tradeoffs - What to Use and Why


When: Available on Demand

REGISTER HERE

 

Abstract:

 

Connectivity, system bandwidth, rise time, and probe location must be carefully considered when probing any target. In addition, the non-ideal probe exhibits parasitic effects that interact with the DUT and can pollute the measurement if not managed properly.

Engineers must commonly probe low and high frequency signals with high signal fidelity. Typical passive probes with high input impedance and capacitance provide good response at lower frequencies, but inappropriately load the circuit and distort signals at higher frequencies. 

Join Teledyne LeCroy for this webinar as we discuss: 
  • Selecting the right probing techniques to maximize the accuracy of your measurements
  • Probe specifications and their implications on the measured signal
  • Variety of probes and accessories available for measurement
  • Virtual probing software tools that allow the user to probe the signal when direct access is physically impossible

 

Presenter: Mark Lionbarger, Field Applications Engineer

 

 

Oscilloscope Automation and Making Custom Measurements Using MATLAB and VB


When: Available on Demand

REGISTER HERE

 

Abstract:

 

This webinar focuses on fast and easy methods to enhance functionality by incorporating custom routines and user-defined algorithms directly into the scope processing path. 

Topics covered will include: Scripting, custom math and measurement examples using MATLAB, Visual Basic Script, Excel Math, C++, and Visual Basic for Applications, combining in-line user-written algorithms and built-in oscilloscope algorithms, dynamic automation, user-defined interfaces, embedding algorithms into panel setups, measurements and math operators, in-line real-time decisions, peak finding, custom filters, inverse FFT, dynamic searching, COM automation and remote control using MATLAB and Visual Basic.
 

Presenter: Mike Hertz, Sr. Field Applications Engineer, Teledyne LeCroy

Cost: Free

 

 

Easy Data Center Testing up to 100Gbps


When: Available On Demand

Duration: 19 minutes


REGISTER HERE

Abstract:
Increased copper & fiber optic cabling within Data Centers drive client installation and verification demands.  Data Center Operations struggle to install, verify and troubleshoot client connections and Data Center Interconnects deployed daily in expanding data centers that require a hand-held, all-in-one tool for testing and troubleshooting at all data rates, using any given interface, located anywhere in the data center. 

 

This brief presentation describes the capabilities and ease of use of the Anritsu MT1x00A Network Master Series for copper and fiber cable testing and verification in one-step.

 
 

Presented by Danny Gonzalez - Optical Transport Business Development Manager at Anritsu Company. Daniel Gonzalez possesses over 16 years’ experience in digital and optical transport testing, development, training and execution spanning technologies including TDM, SONET, OTN, ATM, Carrier Ethernet and Physical Layer Signal Integrity.

 

As an Optical Transport Business Development Manager for Anritsu Company, Daniel is responsible for providing technical support to sales, marketing & customers in North & South America. Daniel holds a B. S. in Telecommunications Management from DeVry University,          is a member of OIF (Optical Internetworking Forum) Networking & Operations Working Group (WG), member of IEEE Communications Society (ComSoc) & has his MEF (Metro Ethernet Forum) Carrier Ethernet 2.0 Professional Certification. He also has several of his articles published in Lightwave, ISE Magazine, Mission Critical and Pipeline publications.